Measurement of charge distribution in Si generated by high energy ion incidence (II)Satoshi Abo, Kenichi Tani,Fujio Wakaya,Shinobu Onoda,Hayato Yamashita,Yuji Miyato,Masayuki AbeThe Japan Society of Applied Physics(2019)引用 23|浏览15暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络