Pressure and temperature dependence of electrical breakdown in liquid heliumTakeyasu Ito,Steven Clayton,Scott Currie,Nguyen Phan,John Ramsey,George M Seidel,Wanchun WeiBulletin of the American Physical Society(2018)引用 23|浏览35暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要