A Test Vector Generation Method Based on Symbol Error Probabilities for Low-Complexity Chase Soft-Decision Reed-Solomon Decoding.

Javier Valls,Vicente Torres,María José Canet,Francisco Miguel Garcia-Herrero

IEEE Transactions on Circuits and Systems I: Regular Papers（2019）

引用 7|浏览16

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摘要

This paper presents a low-complexity chase (LCC) decoder for Reed-Solomon (RS) codes, which uses a novel method for the selection of test vectors that is based on the analysis of the symbol error probabilities derived from simulations. Our results show that the same performance as the classical LCC is achieved with a lower number of test vectors. For example, the amount of test vectors is reduced ...

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关键词

Decoding,Reliability,Complexity theory,Error probability,Binary phase shift keying,Field programmable gate arrays,Encoding

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