Electromagnetic Pattern Extraction and Grouping for Near-Field Scanning of Integrated Circuits by PCA and K-Means Approaches

Electromagnetic patterns in near field scanning usually give important information about the source inside an device under test. In this paper, we develop a postprocessing technique, including standard-deviation-based method, principal component analysis, and K-means method, so that the electromagnetic patterns in near field scanning can be extracted fast and grouped automatically and efficiently....