Fault Mitigation of Switching Lattices under the Stuck-At-Fault Model

2019 IEEE Latin American Test Symposium (LATS)(2019)

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摘要
Switching lattices are two-dimensional arrays composed by four-terminal switches (crossbar arrays). The idea of using regular two-dimensional arrays of switches to implement Boolean functions was proposed by Akers in 1972. Recently, with the advent of a variety of emerging nanoscale technologies, lattices have found a renewed interest. Switching lattices can have a non-negligible defective ratio. In this paper, we analyze the fault tolerance of switching lattices under the stuck-at-fault model (SAFM). We first identify the critical switches with a sensitivity analysis of the lattice. We then propose some techniques to improve the resilience to faults, which are implemented as a post preprocessing step after logic optimization.
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关键词
Switching lattices,Stuck-At-Fault Model,fault tolerance.
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