Effects of mechanical stresses on the reliability of low-temperature polycrystalline silicon thin film transistors for foldable displays

Min Soo Bae,Chuntaek Park,Dongseok Shin,Sang Myung Lee,Ilgu Yun

Solid-State Electronics（2017）

引用 17|浏览5

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摘要

•Dynamic and static mechanical stress tests for the reliability of LTPS TFT.•TFT characteristic variation by mechanical strain dependent lattice constant.•Comparison of dynamic and static mechanical stress.•Comparison of compressive and tensile mechanical stress.

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关键词

Foldable thin film transistor,Static mechanical stress,Dynamic mechanical stress,Low temperature polycrystalline silicon,Reliability

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