Micro-nano manipulator based localized micro-area electrical impedance measurement for polycrystalline ZnO in scanning electron microscope

Ning Cao,Shaorong Xie,Hengyu Li,Yang Yang,Na Liu,Mei Liu,Huayan Pu,Jun Luo,Zhenbang Gong

Materials Letters（2018）

引用 5|浏览12

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摘要

•Micro-area impedances of ZnO grain boundary and grain perform in demand in SEM.•High fitting degree infers relatively uniform doping in a single grain.•Quantitative studies interpret the uneven degree of grain boundary.

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关键词

Electrical properties,Polycrystalline ZnO,Grain boundaries,Micro-area measurement,Scanning electron microscope

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