Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Saurabh Kumar,Minki Cho,Luke Eversen,Hoonki Kim,Qianying Tang,Paul Mazanec,Pascal Meinerzhagen,Andres Malavasi,Dan Lake,Carlos Tokunaga,Heather Quinn,Muhammad Khellah,James Tschanz,Shekhar Borkar,Vivek De,Chris H. Kim

Symposium on VLSI Technology-Digest of Technical Papers（2017）

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摘要

A novel BSC circuit with tunable current starved buffers demonstrates higher sensitivity, scalability & accurate statistical characterization of radiation-induced SET pulse waveforms & flip-flop SER in 14nm tri-gate CMOS, thus enabling improved SER estimation & analysis for a range of supply voltages including NTV.

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关键词

statistical characterization,radiation-induced pulse waveforms,flip-flop soft errors,trigate CMOS,back-sampling chain technique,BSC technique,tunable current starved buffers,radiation-induced SET pulse waveforms,flipflop SER,SER estimation,NTV,size 14 nm

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