Analysis of <italic>V</italic><sub>th</sub> Variations in IGBTs Under Thermal Stress for Improved Condition Monitoring in Automotive Power Conversion Systems

Syed Huzaif Ali
Syed Huzaif Ali
Enes Ugur
Enes Ugur

IEEE Transactions on Vehicular Technology, pp. 193-202, 2019.

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Keywords:
Insulated gate bipolar transistorsAgingLogic gatesStressCapacitanceMore(2+)

Abstract:

Today, power conversion in automotive industry depends heavily on the reliable operation of insulated-gate bipolar transistors (IGBTs). Condition monitoring of IGBTs and reporting imminent faults to driver dashboard are critical for avoiding any fatal accidents. In this study, first, a comprehensive comparison is carried out between on-st...More

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