Retrieving dates in smart card dumps is as hard as finding a needle in a haystack

2017 IEEE Workshop on Information Forensics and Security (WIFS)(2017)

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摘要
This paper introduces a method to automatically retrieve dates from smart card memory dumps when the card specifications are unknown. It exploits specificities of smart cards, using a multi-dump analysis augmented with contextual information. The experiments performed on more than 180 real smart cards show that our method is highly successful in removing false positives.
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关键词
smart card memory dumps,card specifications,haystack
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