Planar multi-patch domain parameterization via patch adjacency graphs.

As a remarkable difference to the existing CAD technology, where shapes are represented by their boundaries, FEM-based isogeometric analysis typically needs a parameterization of the interior of the domain. Due to the strong influence on the accuracy of the analysis, methods for constructing a good parameterization are fundamentally important. The flexibility of single patch representations is often insufficient, especially when more complex geometric shapes have to be represented. Using a multi-patch structure may help to overcome this challenge.