Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers.

IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2016)

引用 22|浏览47
暂无评分
摘要
We propose a self-test method for zero-IF radio frequency transceivers using primarily loopback, aided by a small built-in self-test (BIST) circuitry, to determine critical performance parameters, such as I/Q imbalance and nonlinearity coefficients. The transceiver is placed in the loopback mode by couplers, specifically designed to be asymmetric with respect to the primary path and the BIST path....
更多
查看译文
关键词
Built-in self-test,Transceivers,Radio frequency,Calibration,Delays,Analytical models,Baseband
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要