17.2 5.6Mb/mm2 1R1W 8T SRAM arrays operating down to 560mV utilizing small-signal sensing with charge-shared bitline and asymmetric sense amplifier in 14nm FinFET CMOS technology.

2016 IEEE International Solid-State Circuits Conference (ISSCC)(2016)

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摘要
System-on-Chip (SoC) designs contain a variety of IP blocks which use multiport memories to improve performance by enabling multiple simultaneous operations in the same memory bank. Conventional 2-read/write 8T dual-port SRAMs (2RW) suffer from read and write disturb issues when both wordlines in one row are activated at the same time. 1-read, 1-write 8T decoupled dual port cells (1R1W) eliminate read disturb by preventing charge-sharing with internal storage nodes while the read wordline (RDWL) is activated. Dummy-read disturb can also be prevented in 1R1W arrays by using a non-interleaved design.
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关键词
FinFET CMOS technology,asymmetric sense amplifier,charge-shared bitline,dummy-read disturb,RDWL,read wordline,internal storage nodes,charge-sharing,1R1W,1-read 1-write 8T decoupled dual port cells,read and write disturb issues,2RW,2-read-write 8T dual-port SRAM,multiport memories,IP blocks,SoC designs,system-on-chip designs,size 14 nm
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