A 28 nm 2 Mbit 6 T SRAM With Highly Configurable Low-Voltage Write-Ability Assist Implementation and Capacitor-Based Sense-Amplifier Input Offset Compensation.

IEEE Journal of Solid-State Circuits(2016)

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摘要
This paper presents a highly configurable low-voltage write-ability assist implementation along with a sense-amplifier offset reduction technique to improve SRAM read performance. Write-assist implementation combines negative bit-line (BL) and VDD collapse schemes in an efficient way to maximize Vmin improvements while saving on area and energy overhead of these assists. Relative delay and pulse w...
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关键词
Random access memory,Capacitors,Transistors,Timing,CMOS integrated circuits,Voltage control,Failure analysis
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