An All-Digital Edge Racing True Random Number Generator Robust Against PVT Variations.
IEEE Journal of Solid-State Circuits(2016)
摘要
This paper presents an all-digital true random number generator (TRNG) harvesting entropy from the collapse of two edges injected into one even-stage ring, fabricated in 40 and 180 nm CMOS technologies. A configurable ring and tuning loop provides robustness across a wide range of temperature (-40°C to 120 °C), voltage (0.6 to 0.9 V), process variation, and external attack. The dynamic tuning loop...
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关键词
Delays,Entropy,Tuning,Systematics,Frequency measurement,Robustness,Jitter
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