High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy
IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2015)
摘要
A built-in self-repair (BISR) scheme for random access memories (RAMs) with 2-D redundancy has a built-in redundancy analyzer (BIRA) for allocating the redundancy. The BIRA typically has a cache-like element called local bitmap for storing the fault information temporary. In this paper, a high-repair-efficiency BISR (HRE-BISR) scheme for RAMs is proposed. The HRE-BISR reuses the local bitmap to se...
更多查看译文
关键词
Random access memory,Redundancy,Maintenance engineering,Circuit faults,Built-in self-test,Registers,Resource management
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络