History Erase Effect in a Non-Volatile Memristor.

This work presents a detailed study of the nonlinear dynamics of a tantalum oxide memristor recently fabricated at Hewlett Packard Labs. Our investigations uncover direct current, quasi-static, and alternating current behavior of the nanodevice. A thorough study of the dynamics emerging in the nanoscale element under various input/initial condition combinations reveals a fundamental property of th...