Rf Characterization And Parameter Extraction For Cmos Device Models

Lihong Pan, Robert A Groves,Xiaowei Tian, Zhenrong Jin,L F Wagner

2007 TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS, DIGEST OF PAPERS（2007）

引用 3|浏览5

暂无评分

摘要

We describe the measurement and extraction of high-frequency compact model parameters of MOSFETs for use in design of RF applications.

查看译文

关键词

characterization, compact models, parasitics, RFCMOS

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要