RHIC electron lens test bench diagnostics

D. Gassner, E. Beebe,W. Fischer, X. Gu,K. Hamdi, J. Hock,C. Liu, Toby Miller, A. Pikin,P. Thieberger

OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)(2011)

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摘要
An Electron Lens (E-Lens) system will be installed in RHIC to increase luminosity by counteracting the head-on beam-beam interaction. The proton beam collisions at the RHIC experimental locations will introduce a tune spread due to a difference of tune shifts between small and large amplitude particles. A low energy electron beam will be used to improve luminosity and lifetime of the colliding beams by reducing the betatron tune shift and spread. In preparation for the Electron Lens installation next year, a test bench facility will be used to gain experience with many sub-systems. This paper will discuss the diagnostics related to measuring the electron beam parameters.
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关键词
lens,electron
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