Analysis And Measurement Of Spurious Emission And Phase Noise Performance Of An Rf All-Digital Phase Locked Loop Using A Frequency Discriminator

A Frequency Discriminator in All-Digital Phase Locked Loops (ADPLLs) for RF-synthesis has to fulfill several tough requirements. The most important requirements are the in-band phase noise performance and knowledge about offset frequencies of the spurious emissions, because the ADPLL should fulfill several wireless communication standard requirements like UNITS and GSM. This paper presents a theoretical derivation, simulative analysis, and measurement results for the in-band phase noise level and the offset frequencies of spurious emissions of an ADPLL with a two-bit Frequency Discriminator implemented in a standard 0.13 mu m CMOS technology.