Design, optimization and testing of a multi-beam micro-CT scanner based on multi-beam field emission x-ray technology

As a widely adopted imaging modality for pre-clinical research, micro-CT is constantly facing the need of providing better temporal as well as spatial resolution for a variety of imaging applications. Faster CT scanning speed is also preferred for higher imaging throughput. We recently proposed a gantry-free multi-beam micro-CT (MB mu CT) design which has the potential to overcome some of the intrinsic limitations of current rotating-gantry CT technology. To demonstrate its feasibility, we have constructed a testing system with a multi-beam field emission x-ray (MBFEX) source array with a linear array of 20 individually controllable x-ray emitting pixels. Based on simulations of the electron optics and preliminary experimental measurements the design of the MBFEX source has been further optimized. The newly designed imaging system has been characterized and commissioned following our standard imaging protocol. It has clearly shown improved system stability and enhanced imaging capability. As a result of reduced mechanical rotation during imaging acquisition, we are expecting to achieve higher CT scanning speed without significantly sacrificing imaging quality. This prototype MB mu CT system, although still in its early development phase, has been proved to be an ideal testing platform for the proposed gantry-free micro-CT scanner.