Near-field intensity statistics in semicontinuous metal - dielectric films

Krishanu Seal,Hoondong Noh,Haichuan Cao,Dentcho A Genov,Andrey K Sarychev,Vladimir M Shalaev,Z C Ying

Long Beach, CA（2006）

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摘要

Statistics obtained from the near-field of metal - dielectric films of varying metal concentration indicate the presence of delocalized states at the percolation threshold.

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关键词

(160.3900) metals,(180.5810) scanning microscopy,(240.0310) thin films,(240.5420) polaritons,(240.6680) surface plasmons,(240.6690) surface waves,surface plasmon,thin film,thin films,near field,percolation threshold,metals,surface wave

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