Efficient and accurate testing of on-chip ADC based on ATE

Shuhua Wei,Lan Dai,Xiaobo Zhang,Yanfeng Jiang

Applied Mechanics and Materials（2013）

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摘要

The embedded digital-analog mixed-signal circuit testing has become one of the difficulties to be solved. In this paper, a SoC embedded ADC has been tested based on the Credence Gemini500 verification system. The testing method is studied and verified through the test experiment and results. This testing method is an important reference for general embedded IP core testing. © (2013) Trans Tech Publications, Switzerland.

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关键词

adc testing,ate,mixed-signal,soc,mixed signal

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