A 7.7mW/1.0ns/1.35V delay locked loop with racing mode and OA-DCC for DRAM interface

ISCAS(2010)

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摘要
A 7.7mW/1.0ns/1.35V digital delay locked loop has been proposed in this paper. The dual-DLL architecture with racing operation is adopted to achieve low power operation and low jitter, which is primarily caused by the length of the delay line. The merged dual coarse delay line (MDCDL) is employed for low power and high frequency operation. This DLL utilizes an OR-AND DCC for wide duty cycle correction capability. The proposed DLL for DDR3 SDRAM is fabricated by a 54nm DRAM process technology. Experimental results show that ±10% duty error of external clock can be corrected in less than 400 cycles locking time with 1.0GHz operation frequency at 1.35V.
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关键词
dram process technology,low power operation,time 1 ns,merged dual coarse delay line,jitter,power 7.7 mw,dram interface,low-power electronics,digital delay locked loop,racing mode,dram chips,or-and dcc,clocks,duty cycle correction,high frequency operation,external clock,dual-dll architecture,delay lines,duty error,frequency 1 ghz,delay lock loops,size 54 nm,voltage 1.35 v,low jitter,logic gates,duty cycle,delay lock loop,high frequency,low power electronics
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