Selective Device Structure Scaling and Parasitics Engineering: A Way to Extend the Technology Roadmap

IEEE Transactions on Electron Devices(2009)

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摘要
We propose a path for extending the technology roadmap when currently considered technology boosters (e.g., strain, high-kappa/metal gate) reach their limits and physical gate length can no longer be effectively scaled down. By judiciously engineering the device parasitic resistance and parasitic capacitance, and considering the impact of the interconnect wiring capacitance, we propose scenarios o...
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关键词
Logic gates,Capacitance,Plugs,Silicides,Performance evaluation,Resistance,Delay
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