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论文共 20 篇作者统计合作学者相似作者
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Yan-Kui Liang, Jun-Yang Zheng, Yu-Lon Lin,Yu Chen,Kuan-Lun Chen,Dong-Ru Hsieh,Li-Chi Peng,Ching-Hua Chiu, Yu-Chcng Lu, Tsung-Te Chou,Chi-Chung Kei,Chun-Chieh Lu,
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
Yan-Kui Liang, June-Yang Zheng,Jing-Wei Lin, Yi Miao Hua, Tsung-Te Chou,Chun-Chieh Lu,Huai-Ying Huang,Yu-Ming Lin,Chi-Chung Kei, Edward-Yi Chang,Chun-Hsiung Lin
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)pp.1-3, (2023)
引用0浏览0EIWOS引用
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0
Yan-Kui Liang,Wei-Li Li, Jun-Yang Zheng, Yu-Lon Lin,Yu-Cheng Lu,Ching-Hua Chiu,Dong-Ru Hsieh, Tsung-Te Chou,Chi-Chung Kei,Huai-Ying Huang,Yu-Ming Lin,Yuan-Chieh Tseng,
IEEE Electron Device Lettersno. 10 (2023): 1644-1647
Zhen-Hong Huang,Tsung-Ying Yang,Jui-Sheng Wu,Yan-Kui Liang, Jen-Fu Hsu,Wei-Cheng Lin,Tian-Li Wu, Edward Yi Chang
MICROELECTRONICS RELIABILITY (2023): 115215-115215
Dong-Ru Hsieh, Jia-Chian Ni, Wei-Ju Yeh,Tzu-Chieh Hong,Zi-Yang Hong,Yan-Kui Liang,Huai-En Luo, Michael Hsu,Ta-Chun Cho,Tien-Sheng Chao
2023 Silicon Nanoelectronics Workshop (SNW)pp.113-114, (2023)
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Yan-Kui Liang, June-Yang Zheng, Yu-Lon Lin,Wei-Li Li,Yu-Cheng Lu,Dong-Ru Hsieh,Li-Chi Peng, Tsung-Te Chou,Chi-Chung Kei,Chun-Chieh Lu,Huai-Ying Huang,Yuan-Chieh Tseng,
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)pp.1-2, (2023)
引用1浏览0EIWOS引用
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Yan-Kui Liang, June-Yang Zheng,Jing-Wei Lin, Yi Miao Hua, Tsung-Te Chou,Chun-Chieh Lu,Huai-Ying Huang,Yu-Ming Lin,Chi-Chung Kei, Edward-Yi Chang,Chun-Hsiung Lin
2023 7TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM (2023)
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Yan-Kui Liang, June-Yang Zheng, Yu-Lon Lin,Wei-Li Li, Yu-Cheng Lu,Dong-Ru Hsieh,Li-Chi Peng, Tsung-Te Chou,Chi-Chung Kei,Chun-Chieh Lu,Huai-Ying Huang,Yuan-Chieh Tseng,
VLSI Technology and Circuitspp.1-2, (2023)
引用2浏览0EI引用
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Yan-Kui Liang,Jing-Wei Lin,Li-Chi Peng, Yi Miao Hua, Tsung-Te Chou,Chi-Chung Kei,Chun-Chieh Lu,Huai-Ying Huang,Sai Hooi Yeong,Yu-Ming Lin,Po-Tsun Liu, Edward-Yi Chang,
IEEE Transactions on Electron Devicesno. 3 (2023): 1067-1072
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